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IJSTR >> Volume 3- Issue 2, February 2014 Edition

International Journal of Scientific & Technology Research  
International Journal of Scientific & Technology Research

Website: http://www.ijstr.org

ISSN 2277-8616

Soft Error Detection And Correction For Configurable Memory Of Reconfigurable System

[Full Text]



Babu. M, Saranya. S, Preethy. V, Gurumoorthy. J



Key Words: configurable memories, single event and double event upsets, soft error, hamming code, reed Solomon code.



Abstract: The size of integrated Circuits has developed rapidly and now their size has reached nano scale which makes the embedded memories more sensitive to Single Event Upsets (SEUs) or Double Event Upsets (DEUs). In particular the reconfigurable system which contains configured memories are more likely to suffer from soft error caused by SEUs or DEUs. In this paper we develop a Reed Solomon code based Error Detection and Correction circuits (EDAC) that can protect the configuration memory of reconfigurable systems from SEUs or DEUs. The existing Hamming code based EDAC circuit can detect two bit error but can correct only single bit error whereas the proposed Reed Solomon code based EDAC circuit can detect and correct multi bit error. This circuit has better dependability. The main drawback of this method is that it needs large area overhead when compared to other conventional methods such as Triple Modular Redundancy (TMR).



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